Téléchargez le livre : Analog IC Reliability in Nanometer CMOS

Analog IC Reliability in Nanometer CMOS

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Éditeur :

Springer


Collection :

Analog Circuits and Signal Processing

Paru le : 2013-01-11

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Description

This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.
The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.
Pages
198 pages
Collection
Analog Circuits and Signal Processing
Parution
2013-01-11
Marque
Springer
EAN papier
9781461461623
EAN EPUB
9781461461630
Informations sur l'ebook
Nombre pages copiables
1
Nombre pages imprimables
19
Taille du fichier
3461 Ko
Prix
95,39 €

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