Téléchargez le livre : Lock-in Thermography

Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials de

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Éditeur :

Springer


Collection :

Springer Series in Advanced Microelectronics

Paru le : 2019-01-09

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Description


This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
Pages
321 pages
Collection
Springer Series in Advanced Microelectronics
Parution
2019-01-09
Marque
Springer
EAN papier
9783319998244
EAN PDF
9783319998251
Informations sur l'ebook
Nombre pages copiables
3
Nombre pages imprimables
32
Taille du fichier
12831 Ko
Prix
158,24 €
EAN EPUB
9783319998251
Informations sur l'ebook
Nombre pages copiables
3
Nombre pages imprimables
32
Taille du fichier
106179 Ko
Prix
158,24 €

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