Nanoscale Memory Repair

de

,

Éditeur :

Springer


Collection :

Integrated Circuits and Systems

Paru le : 2011-01-11

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Description
Yield and reliability of memories have degraded with device and voltage scaling in the nano-scale era, due to ever-increasing hard/soft errors and device parameter variations. This book systematically describes these yield and reliability issues in terms of mathematics and engineering, as well as an array of repair techniques, based on the authors’ long careers in developing memories and low-voltage CMOS circuits. Nanoscale Memory Repair gives a detailed explanation of the various yield models and calculations, as well as various, practical logic and circuits that are critical for higher yield and reliability.
Pages
218 pages
Collection
Integrated Circuits and Systems
Parution
2011-01-11
Marque
Springer
EAN papier
9781441979575
EAN EPUB
9781441979582

Informations sur l'ebook
Nombre pages copiables
2
Nombre pages imprimables
21
Taille du fichier
3564 Ko
Prix
105,49 €