Télécharger le livre :  Power-Constrained Testin of VLSI Circuts
Minimization of power dissipation in very large scale integrated (VLSI) circuits is important to improve reliability and reduce packaging costs. While many techniques have investigated power...

Editeur : Kluwer Academic Publishers
Parution : 2009
PDF

120,69

Téléchargement immédiat
Dès validation de votre commande