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Télécharger le livre : Extreme Statistics in Nanoscale Memory Design
Rob A. Rutenbar , Amith Singhee
Extreme Statistics in Nanoscale Memory Design
Knowledge exists: you only have to ?nd it VLSI design has come to an important in?ection point with the appearance of large manufacturing variations as semiconductor technology has moved to 45 nm feature sizes and below. If we ignore the random variations in the...
Editeur : Springer
Parution : 2010-09-09
Collection : Integrated Circuits and Systems
Format(s) : ePub
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