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Télécharger le livre : Variation-Aware Advanced CMOS Devices and SRAM
Changhwan Shin
Variation-Aware Advanced CMOS Devices and SRAM
This book provides a comprehensive overview of contemporary issues in complementary metal-oxide semiconductor (CMOS) device design, describing how to overcome process-induced random variations such as line-edge-roughness, random-dopant-fluctuation, and work-function...
Editeur : Springer
Parution : 2016-06-06
Collection : Springer Series in Advanced Microelectronics
Format(s) : ePub
52,74 €
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