Télécharger le livre :  Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

This book evaluates the influence of process variations (e.g. work-function fluctuations) and radiation-induced soft errors in a set of logic cells using FinFET technology, considering the 7nm technological node as a case study. Moreover, for accurate soft error...
Editeur : Springer
Parution : 2021-03-10

Format(s) : PDF
73,84

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