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Surface Analysis with STM and AFM
Sergei N. Magonov , Myung-Hwan Whangbo
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image...

Editeur : Wiley-VCH
Parution : 2008-09-26
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