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Télécharger le livre : Science and Technology of Defects in Silicon
A. Chantre , C.A.J. Ammerlaan , P. Wagner
Science and Technology of Defects in Silicon
This volume reviews recent developments in the materials science of silicon. The topics discussed range from the fundamental characterization of the physical properties to the assessment of materials for device applications, and include: crystal growth; process-induced...
Editeur : North Holland
Parution : 2014-01-01

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