Télécharger le livre :  Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies
This book presents a new methodology with reduced time impact to address the problem of analog integrated circuit (IC) yield estimation by means of Monte Carlo (MC) analysis, inside an optimization loop of a population-based algorithm. The low time impact on the overall...

Editeur : Springer
Parution : 2020-03-20
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