7 résultat(s)
Télécharger le livre : Applications and Metrology at Nanometer-Scale 2
Pierre-Richard Dahoo , Abdelkhalak El Hami , Philippe Pougnet
Applications and Metrology at Nanometer-Scale 2
Nanoscience, nanotechnologies and the laws of quantum physics are sources of disruptive innovation that open up new fields of application. Quantum engineering enables the development of very sensitive materials, sensor measurement systems and computers. Quantum...
Editeur : Wiley-ISTE
Parution : 2021-04-14

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163,47 €
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Télécharger le livre : Applications and Metrology at Nanometer Scale 1
Pierre-Richard Dahoo , Abdelkhalak El Hami , Philippe Pougnet
Applications and Metrology at Nanometer Scale 1
To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the...
Editeur : Wiley-ISTE
Parution : 2021-01-14

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163,47 €
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Télécharger le livre : Embedded Mechatronic Systems 2
Abdelkhalak El Hami , Philippe Pougnet
Embedded Mechatronic Systems 2
Embedded Mechatronic Systems 2: Analysis of Failures, Modeling, Simulation and Optimization presents advances in research within the field of mechatronic systems, which integrates reliability into the design process. Providing many detailed examples, this book develops...
Editeur : Iste Press - Elsevier
Parution : 2020-02-28

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98,06 €
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Télécharger le livre : Embedded Mechatronic Systems
Abdelkhalak El Hami , Philippe Pougnet
Embedded Mechatronic Systems
Mechatronics brings together computer science, mechanics and electronics. It enables us to improve the performances of embedded electronic systems by reducing their weight, volume, energy consumption and cost. Mechatronic equipment must operate without failure...
Editeur : Iste Press - Elsevier
Parution : 2019-11-26

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98,06 €
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Télécharger le livre : Nanometer-scale Defect Detection Using Polarized Light
Pierre-Richard Dahoo , Abdelkhalak El Hami , Philippe Pougnet
Nanometer-scale Defect Detection Using Polarized Light
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques...
Editeur : Wiley-ISTE
Parution : 2016-08-16

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163,47 €
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Télécharger le livre : Embedded Mechatronic Systems, Volume 1
Abdelkhalak El Hami , Philippe Pougnet
Embedded Mechatronic Systems, Volume 1
In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components which induce failure mechanisms should be identified and modeled for better...
Editeur : Iste Press - Elsevier
Parution : 2015-07-16

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97,75 €
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Télécharger le livre : Embedded Mechatronic Systems, Volume 2
Abdelkhalak El Hami , Philippe Pougnet
Embedded Mechatronic Systems, Volume 2
In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components induce failure mechanisms should be identified and modeled for better control....
Editeur : Iste Press - Elsevier
Parution : 2015-07-16

Format(s) : PDF, epub sans DRM
98,06 €
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